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- /* SPDX-License-Identifier: GPL-2.0+ */
- /*
- * Copyright (c) 2013 Google, Inc.
- */
- #ifndef __TEST_TEST_H
- #define __TEST_TEST_H
- #include <malloc.h>
- #include <linux/bitops.h>
- /*
- * struct unit_test_state - Entire state of test system
- *
- * @fail_count: Number of tests that failed
- * @start: Store the starting mallinfo when doing leak test
- * @of_live: true to use livetree if available, false to use flattree
- * @of_root: Record of the livetree root node (used for setting up tests)
- * @root: Root device
- * @testdev: Test device
- * @force_fail_alloc: Force all memory allocs to fail
- * @skip_post_probe: Skip uclass post-probe processing
- * @expect_str: Temporary string used to hold expected string value
- * @actual_str: Temporary string used to hold actual string value
- */
- struct unit_test_state {
- int fail_count;
- struct mallinfo start;
- struct device_node *of_root;
- bool of_live;
- struct udevice *root;
- struct udevice *testdev;
- int force_fail_alloc;
- int skip_post_probe;
- char expect_str[512];
- char actual_str[512];
- };
- /* Test flags for each test */
- enum {
- UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
- UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
- UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
- UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
- UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
- UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
- /* do extra driver model init and uninit */
- UT_TESTF_DM = BIT(6),
- };
- /**
- * struct unit_test - Information about a unit test
- *
- * @name: Name of test
- * @func: Function to call to perform test
- * @flags: Flags indicated pre-conditions for test
- */
- struct unit_test {
- const char *file;
- const char *name;
- int (*func)(struct unit_test_state *state);
- int flags;
- };
- /**
- * UNIT_TEST() - create linker generated list entry for unit a unit test
- *
- * The macro UNIT_TEST() is used to create a linker generated list entry. These
- * list entries are enumerate tests that can be execute using the ut command.
- * The list entries are used both by the implementation of the ut command as
- * well as in a related Python test.
- *
- * For Python testing the subtests are collected in Python function
- * generate_ut_subtest() by applying a regular expression to the lines of file
- * u-boot.sym. The list entries have to follow strict naming conventions to be
- * matched by the expression.
- *
- * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
- * foo that can be executed via command 'ut foo bar' and is implemented in
- * function foo_test_bar().
- *
- * @_name: concatenation of name of the test suite, "_test_", and the name
- * of the test
- * @_flags: an integer field that can be evaluated by the test suite
- * implementation
- * @_suite: name of the test suite concatenated with "_test"
- */
- #define UNIT_TEST(_name, _flags, _suite) \
- ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
- .file = __FILE__, \
- .name = #_name, \
- .flags = _flags, \
- .func = _name, \
- }
- /* Get the start of a list of unit tests for a particular suite */
- #define UNIT_TEST_SUITE_START(_suite) \
- ll_entry_start(struct unit_test, ut_ ## _suite)
- #define UNIT_TEST_SUITE_COUNT(_suite) \
- ll_entry_count(struct unit_test, ut_ ## _suite)
- /* Use ! and ~ so that all tests will be sorted between these two values */
- #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
- #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
- #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
- /* Sizes for devres tests */
- enum {
- TEST_DEVRES_SIZE = 100,
- TEST_DEVRES_COUNT = 10,
- TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
- /* A few different sizes */
- TEST_DEVRES_SIZE2 = 15,
- TEST_DEVRES_SIZE3 = 37,
- };
- /**
- * testbus_get_clear_removed() - Test function to obtain removed device
- *
- * This is used in testbus to find out which device was removed. Calling this
- * function returns a pointer to the device and then clears it back to NULL, so
- * that a future test can check it.
- */
- struct udevice *testbus_get_clear_removed(void);
- static inline void arch_reset_for_test(void)
- {
- #ifdef CONFIG_SANDBOX
- #include <asm/state.h>
- state_reset_for_test(state_get_current());
- #endif
- }
- #endif /* __TEST_TEST_H */
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