Sebastian Reichel
|
2aefa6e3f2
i2c: add dm_i2c_reg_clrset
|
2 年之前 |
Simon Glass
|
a20b4a8cfb
dm: test: Drop assumptions of no sequence numbers
|
3 年之前 |
Simon Glass
|
e180c2b129
dm: Rename DM test flags to make them more generic
|
3 年之前 |
Simon Glass
|
0e1fad4382
dm: core: Drop header files from dm/test.h
|
3 年之前 |
Simon Glass
|
f91f366bd5
test: Use ut_asserteq_mem() where possible
|
4 年之前 |
Robert Beckett
|
951674ac7e
dm: i2c: EEPROM simulator add tests for addr offset mask
|
4 年之前 |
Robert Beckett
|
22e93511be
dm: i2c: EEPROM simulator allow tests visibility of addr and offset
|
4 年之前 |
Simon Glass
|
031a650e13
dm: sandbox: i2c: Use new emulator parent uclass
|
5 年之前 |
Tom Rini
|
83d290c56f
SPDX: Convert all of our single license tags to Linux Kernel style
|
6 年之前 |
Simon Glass
|
911954859d
dm: Use dm_scan_fdt_dev() directly where possible
|
8 年之前 |
Joe Hershberger
|
e721b882e9
test: Generalize the unit test framework
|
9 年之前 |
Simon Glass
|
182bf92d19
dm: i2c: Add an explicit test mode to the sandbox I2C driver
|
9 年之前 |
Simon Glass
|
ca88b9b939
dm: i2c: Add a dm_ prefix to driver model bus speed functions
|
9 年之前 |
Simon Glass
|
25ab4b0303
dm: i2c: Provide an offset length parameter where needed
|
9 年之前 |
Simon Glass
|
f9a4c2da72
dm: i2c: Rename driver model I2C functions to permit compatibility
|
9 年之前 |
Simon Glass
|
ecc2ed55ee
dm: i2c: Add tests for I2C
|
9 年之前 |