|
@@ -56,6 +56,7 @@ static int dm_test_cros_ec_features(struct unit_test_state *uts)
|
|
|
ut_assertok(uclass_first_device_err(UCLASS_CROS_EC, &dev));
|
|
|
ut_assertok(cros_ec_get_features(dev, &feat));
|
|
|
ut_asserteq_64(1U << EC_FEATURE_FLASH | 1U << EC_FEATURE_I2C |
|
|
|
+ 1u << EC_FEATURE_VSTORE |
|
|
|
1ULL << EC_FEATURE_UNIFIED_WAKE_MASKS | 1ULL << EC_FEATURE_ISH,
|
|
|
feat);
|
|
|
|
|
@@ -68,6 +69,7 @@ static int dm_test_cros_ec_features(struct unit_test_state *uts)
|
|
|
ut_assertok(run_command("crosec features", 0));
|
|
|
ut_assert_nextline("flash");
|
|
|
ut_assert_nextline("i2c");
|
|
|
+ ut_assert_nextline("vstore");
|
|
|
ut_assert_nextline("unified_wake_masks");
|
|
|
ut_assert_nextline("ish");
|
|
|
ut_assert_console_end();
|
|
@@ -138,3 +140,39 @@ static int dm_test_cros_ec_events(struct unit_test_state *uts)
|
|
|
return 0;
|
|
|
}
|
|
|
DM_TEST(dm_test_cros_ec_events, UT_TESTF_SCAN_FDT);
|
|
|
+
|
|
|
+static int dm_test_cros_ec_vstore(struct unit_test_state *uts)
|
|
|
+{
|
|
|
+ const int size = EC_VSTORE_SLOT_SIZE;
|
|
|
+ u8 test_data[size], data[size];
|
|
|
+ struct udevice *dev;
|
|
|
+ u32 locked;
|
|
|
+ int i;
|
|
|
+
|
|
|
+ ut_assertok(uclass_first_device_err(UCLASS_CROS_EC, &dev));
|
|
|
+ ut_asserteq(true, cros_ec_vstore_supported(dev));
|
|
|
+
|
|
|
+ ut_asserteq(4, cros_ec_vstore_info(dev, &locked));
|
|
|
+ ut_asserteq(0, locked);
|
|
|
+
|
|
|
+ /* Write some data */
|
|
|
+ for (i = 0; i < size; i++)
|
|
|
+ test_data[i] = ' ' + i;
|
|
|
+ ut_assertok(cros_ec_vstore_write(dev, 2, test_data, size));
|
|
|
+
|
|
|
+ /* Check it is locked */
|
|
|
+ ut_asserteq(4, cros_ec_vstore_info(dev, &locked));
|
|
|
+ ut_asserteq(1 << 2, locked);
|
|
|
+
|
|
|
+ /* Read it back and compare */
|
|
|
+ ut_assertok(cros_ec_vstore_read(dev, 2, data));
|
|
|
+ ut_asserteq_mem(test_data, data, size);
|
|
|
+
|
|
|
+ /* Try another slot to make sure it is empty */
|
|
|
+ ut_assertok(cros_ec_vstore_read(dev, 0, data));
|
|
|
+ for (i = 0; i < size; i++)
|
|
|
+ ut_asserteq(0, data[i]);
|
|
|
+
|
|
|
+ return 0;
|
|
|
+}
|
|
|
+DM_TEST(dm_test_cros_ec_vstore, UT_TESTF_SCAN_FDT);
|