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- // SPDX-License-Identifier: GPL-2.0+
- /*
- * Copyright (c) 2019 Heinrich Schuchardt <xypron.glpk@gmx.de>
- *
- * Unit tests for memory functions
- *
- * The architecture dependent implementations run through different lines of
- * code depending on the alignment and length of memory regions copied or set.
- * This has to be considered in testing.
- */
- #include <common.h>
- #include <command.h>
- #include <errno.h>
- #include <test/lib.h>
- #include <test/test.h>
- #include <test/ut.h>
- /**
- * lib_errno_str() - unit test for errno_str()
- *
- * Test errno_str() with varied alignment and length of the copied buffer.
- *
- * @uts: unit test state
- * Return: 0 = success, 1 = failure
- */
- static int lib_errno_str(struct unit_test_state *uts)
- {
- const char *msg;
- msg = errno_str(1);
- ut_asserteq_str("Success", msg);
- msg = errno_str(0);
- ut_asserteq_str("Success", msg);
- msg = errno_str(-ENOMEM);
- ut_asserteq_str("Out of memory", msg);
- msg = errno_str(-99999);
- ut_asserteq_str("Unknown error", msg);
- return 0;
- }
- LIB_TEST(lib_errno_str, 0);
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