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+/*
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+ * Copyright (C) 2013 Google, Inc
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+ *
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+ * SPDX-License-Identifier: GPL-2.0+
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+ */
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+
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+#include <common.h>
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+#include <dm.h>
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+#include <fdtdec.h>
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+#include <spi.h>
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+#include <spi_flash.h>
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+#include <asm/state.h>
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+#include <dm/ut.h>
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+#include <dm/test.h>
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+#include <dm/util.h>
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+
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+/* Test that sandbox SPI flash works correctly */
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+static int dm_test_spi_flash(struct dm_test_state *dms)
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+{
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+ /*
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+ * Create an empty test file and run the SPI flash tests. This is a
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+ * long way from being a unit test, but it does test SPI device and
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+ * emulator binding, probing, the SPI flash emulator including
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+ * device tree decoding, plus the file-based backing store of SPI.
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+ *
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+ * More targeted tests could be created to perform the above steps
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+ * one at a time. This might not increase test coverage much, but
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+ * it would make bugs easier to find. It's not clear whether the
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+ * benefit is worth the extra complexity.
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+ */
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+ ut_asserteq(0, run_command_list(
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+ "sb save hostfs - spi.bin 0 200000;"
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+ "sf probe;"
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+ "sf test 0 10000", -1, 0));
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+ /*
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+ * Since we are about to destroy all devices, we must tell sandbox
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+ * to forget the emulation device
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+ */
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+ sandbox_sf_unbind_emul(state_get_current(), 0, 0);
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+
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+ return 0;
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+}
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+DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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